The equipment allows the realization of these tests at different States of Charge, constantly monitoring the cell/module temperature and pressure. Moreover, the equipment is explosion-proofed and allows sampling to up to 3 gas samples.
The Probe station has a chuck that can support up to 6" wafers with very fine x, y and angular movement. The top microscope allows the correct alignment of the probes with the devices under test. Up to four probes are available, two of them with triaxial cable for extremely precise electrical measurement; the other two have coaxial connections. The Probe station has a soft contact tool that allows a semi-automatic movement to contact the probe tips to the devices without putting too much pressure.
Probe station with puck controlled air-bearing stage: